Non-destructive photoluminescence investigation of PV devices with high spatial resolution microscope techniques

Investigations of photovoltaic devices and semiconductors are essential to enhance the efficiency of preparation methods as well as their electronic and optical properties. We present a powerful combination of time-resolved photoluminescence microscopy with a spectrometer, which results in a powerful toolbox for researcher. This combination of microscopic (e.g., FLIM, PLIM or carrier diffusion imaging) and spectroscopic methods like wavelength dependent emission scanning enables investigations of photophysical properties of semiconductors, nanoparticles and nanostructures on a whole new level.