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Characterization of Double HfZrO2 Based FeFET Toward Low-Voltage Multi-Level Operation for High Density Nonvolatile Memory

Z.-F. Lou,C.-Y. Liao,K.-Y. Hsiang,C.-Y. Lin,Y.-D. Lin,P.-C. Yeh, C.-Y. Wang,H.-Y. Yang,P.-J. Tzeng,T.-H. Hou,Y.-T. Tang,M. H. Lee

2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)（2022）

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关键词
Low voltage,Power demand,Nonvolatile memory,Memory management,Voltage,Very large scale integration,FeFETs
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