A Smart SRAM-Cell Array for the Experimental Study of Variability Phenomena in CMOS Technologies

P. Saraza-Canflanca, H. Carrasco-Lopez,A. Santana-Andreo,J. Diaz-Fortuny,R. Castro-Lopez,E. Roca,F. V. Fernandez

2022 IEEE International Reliability Physics Symposium (IRPS)（2022）

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摘要

Time-Dependent Variability phenomena can have a considerable impact on circuit performance, especially for deeply-scaled technologies. To account for this, these phenomena need to be characterized and modelled. Such characterization is often performed at the device level first. Then, the model extracted from such characterization should be validated at the circuit level. To this end, this paper pr...

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关键词

Performance evaluation,Semiconductor device modeling,Temperature distribution,Circuit optimization,SRAM cells,CMOS technology,Feature extraction

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