Universal Hot Carrier Degradation Model under DC and AC Stresses

Chu Yan,Yaru Ding,Yiming Qu,Liang Zhao,Yi Zhao

2022 IEEE International Reliability Physics Symposium (IRPS)（2022）

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摘要

In this study, the impact of the self-heating effect (SHE) on the activation energy of hot-carrier injection (HCI) has been studied in n-FinFETs by correcting the channel temperature under different stress patterns. We also experimentally investigated why stress patterns with a shorter pulse width pstress result in a longer device lifetime. In addition to the inevitable SH, time-resolved particle ...

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关键词

Human computer interaction,Degradation,Correlation,Predictive models,Hot carrier injection,Data models,Reliability

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