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Endurance Evaluation on OTS-PCM Device Using Constant Current Stress Scheme

W. C. Chien,C. H. Yang,C. W. Yeh,H. Y. Cheng,I. T. Kuo,E. K. Lai,C. S. Hsu,H. L. Lung,Y. C. Chou,H. Y. Ho,L. M. Gignac,N. Gong,W. Kim,C. W. Cheng,L. Buzi,A. Ray,R. L. Bruce,M. BrightSky

2022 IEEE International Reliability Physics Symposium (IRPS)（2022）

Cited 2|Views64
Key words
Constant current stress,Endurance,OTS,PCM
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