Cross-Calibration of Various SEE Test Methods Including Pulsed X-rays and Application to SEL and SEU

G. Augustin, M. Mauguet, N. Andrianjohany, N. Chatry,F. Bezerra, E. Capria, M. Sander, K-O. Voss

2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)(2019)

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Abstract
This work is a contribution to the use of alternative SEE test methods. We first report collected charge measurements and simulations in a p-i-n photodiode. The main purpose was to evaluate parameters leading to the correlation between heavy ion broadbeam and microbeam, pulsed X-rays and laser pulses. This study also relies on coupled and analytical simulation to further understand the physical ph...
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Key words
Correlation,Shape,Semiconductor lasers,Measurement by laser beam,X-rays,X-ray lasers,Ions
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