A 1-Tb Density 4b/Cell 3D-NAND Flash on 176-Tier Technology with 4-Independent Planes for Read using CMOS-Under-the-Array
2022 IEEE International Solid- State Circuits Conference (ISSCC)(2022)
Abstract
This paper presents a1Tb 4b/cell 3D-NAND-Flash memory on a 176-tier technology with a 14.7Gb/mm2 bit density. The die is organized using a 4-plane architecture for multiplane operations with a 16KB page size. The 1×4 plane architecture improves both program and read throughput, without increasing the die size. Periphery circuitry and page buffers are placed under the array using 5th-gen...
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Key words
Performance evaluation,Concurrent computing,Conferences,Voltage,Programming,Throughput,Reliability engineering
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