In situ measurements of texture and phase development in (Bi, Pb) 2 Sr 2 Ca 2 Cu 3 O 10 –Ag tapes

Hard x-rays from a synchrotron source were utilized in diffraction experiments performed at elevated temperatures (up to ~ 870 °C) on (Bi, Pb) 2 Sr 2 Ca 2 Cu 3 O 10 (Bi-2223) tapes completely encased in silver. The general behavior of the phase and texture development under typical processing conditions was determined, and the effects that several variations in processing conditions had on the phase and texture development were examined. These results and their implications for improving processing conditions are discussed.