Processing and characterization of compositionally modified PbTiO 3 thin films prepared by pulsed laser deposition

Modified lead titanate of 0.9PbTiO 3 −0.1Pb(Mg 0.5 W 0.5 )O 3 thin films have been deposited onto Pt-coated Si substrates by pulsed laser deposition. Films were crystallized in situ during deposition or by post-depositional heat treatment (post-annealing). Compositional and structural characterization showed that the phase formation and microstructure of the films were highly sensitive to deposition conditions. Perovskite single phase films were formed in situ at 650 °C, P O2 = 40 Pa as well as by post-annealing amorphous films at 650 °C. In the post-annealing process, the amorphous as-deposited phase was crystallized to perovskite and/or pyrochlore, and the ratio of perovskite to pyrochlore was found to be influenced by the depositional P O2 . Depending on the deposition temperature, the grain structures of the crystallized films were columnar or equiaxed. A relatively homogeneous surface morphology was obtained by deposition at a lower pressure ( P O2 = 13 Pa). The in situ crystallized films showed variable crystallographic orientation. The more (111) oriented films had the lowest remanent polarizations and the highest coercive fields. A method for preparing randomly oriented films, via a two-step deposition process with intermediate annealing, is believed to give the most consistent results and the best ferroelectric properties at the present level of development.