Design for 3D Stacked Circuits

P. Franzon,W. Davis,E. Rotenberg, J. Stevens, S. Lipa, T. Nigussie, H. Pan, L. Baker, J. Schabel,S. Dey, W. Li

2021 IEEE International Electron Devices Meeting (IEDM)(2021)

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摘要
2.5D and 3D technologies can give rise to a node equivalent of scaling due to improved connectivity. Aggressive exploitation scenarios include functional partitioning, circuit partitioning, logic on DRAM, design obfuscation and modular chiplets. Design issues that need to be addressed in pursuing such exploitations include thermal management, design for test and computer aided design.
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关键词
Three-dimensional displays,Design automation,Thermal management,Electron devices
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