Chrome Extension
WeChat Mini Program
Use on ChatGLM
VIPCreated with Sketch.

Experimental Setup for in Situ Investigation of Phase Changing Behavior in Phase-Change Random-Access Memory Medium by Microfocusing Nanosecond-Time-Resolved Ellipsometry

Younhwa Kim,Sang Jun Kim,Sang Youl Kim,Sung Hyuck An,Dongseok Suh, Jin Seo Noh,Sang Mock Lee,Ki-Joon Kim, Woong Chul Shin,Yoon-Ho Khang

Japanese Journal of Applied Physics（2006）

Cited 3|Views0
No score
Abstract
An ellipsometer with nanosecond time resolution has been proposed for the investigation of the phase change behavior of Ge2Sb2Te5 heated by electrical pulses of 20–100 ns in real time. This passive single-wavelength ellipsometer has a division-of-amplitude photopolarimeter (DOAP) configuration for polarization state detection to collect ellipsometric data in nanoseconds and consists of a microfocusing lens system to achieve a spot size of ~15 µm.
More
Translated text
Key words
Ge-Sb-Te,phase change optical disk,PRAM,time-resolved ellipsometry,crystallization kinetic
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined