Optical properties of slightly rough LaNiO3 thin films studiedby spectroscopic ellipsometry and reflectometry
Applied Surface Science(2005)
摘要
Optical characterization of sol-gel deposited lanthanum nickel
oxide, LaNiO3 (LNO) film on Pt-coated Si substrate was
performed by spectroscopic ellipsometry and reflectometry. The
sum of five Lorentz oscillators was used for LNO dispersion
parameterization in spectral range from 190 to 1000 nm. Two
theoretical approaches: Raileigh-Rice theory (RRT) and
effective medium approximation (EMA) were considered to account
for the effect of LNO upper boundary roughness. Root mean
square (rms) values of the heights of irregularities obtained
by atomic force microscopy (AFM) and RRT were 2.09 and 5.62 nm,
respectively. Effective layer thickness in EMA approach was
found to be 4.62 nm. Higher values of roughness determined from
optical methods with respect to the AFM may be assigned to the
effect of convolution of AFM tip and boundary irregularities.
更多查看译文
关键词
Thin Film Analysis,Roughness Measurement,Surface Characterization,Ellipsometry
AI 理解论文
溯源树
样例
![](https://originalfileserver.aminer.cn/sys/aminer/pubs/mrt_preview.jpeg)
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要