Multi-pillar SOT-MRAM for Accurate Analog in-Memory DNN Inference

2021 Symposium on VLSI Technology(2021)

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摘要
Deep neural network (DNN) inference can be performed efficiently with analog in memory computing (AiMC). MRAM is an attractive solution to implement the DNN weights due to its non-volatility and scalability. However, accurate inference requires memories with multi-level conductance values. while MRAM is binary. In this work, we propose and demonstrate a multi-level SOT-MRAM device concept by placing multiple MTJ pillars between a single SOT track and common top electrode. Selective level programming is achieved by smartly using a pillar-position dependent VCMA-assist effect. Three DNN algorithm-driven technology requirements are derived: number of conductance levels, bit-error rate and conductance variation. This work demonstrates that multi-pillar SOT-MRAM meets all derived specifications, making it a promising candidate as memory device for accurate analog in-memory DNN inference.
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