Organic thin film thickness profile and refractive index measurements by white-light scanning interferometer
Optical Interference Coatings 2016 (2016), paper ThB.9（2016）
摘要
The article investigated the dependence of the sensitivities of the Fourier amplitude and nonlinear phase spectra on the thin-film properties. A method has been applied to measure organic thin-film thickness profile and refractive index.
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