Separate deconvolution: for three-dimensional speckle imaging fluorescence microscopy

Awoke Negash,Simon Labouesse,Anne Sentenac,Hugues Giovannini,Kamal Belkebir,Marc Allain,Jérôme Idier,Rainer Heintzmann,Patrick C. Chaumet,Nicolas Sandeau

Imaging and Applied Optics 2016 (2016), paper MTh1H.2（2016）

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摘要

We present a structured illumination microscopy inversion technique using separate blind deconvolution of individual speckle images. By summing the reconstructions of all speckle images, one obtains transversal and axial resolution improvement compared to widefield deconvolution techniques.

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