Influence of defect structure on characteristics of X- and gamma-radiation detectors based on CdTe:Cl according to high-resolution X-ray diffractometry

The defect structure of p-CdTe:Cl single crystals and MoOx/p-CdTe/MoOx heterostructures based on them were investigated by high-resolution X-ray diffractometry methods. Different models of dislocation systems were applied, according to which the densities of dislocations were estimated from the Wilson-Hall plot. It is shown that the application of the MoOx layer significantly affects the density of dislocations and their influence on the electrical and spectroscopic properties of heterostructures is estimated.