In Situ Measurement of TID-Induced Leakage Using On-Chip Frequency Modulation
IEEE transactions on nuclear science（2022）
关键词
Current measurement,System-on-chip,Leakage currents,Radiation effects,Frequency measurement,Transistors,Capacitors,Dosimetry,integrated circuit radiation effects,ion radiation effects,ionizing dose,ionizing radiation,leakage current,mixed signal circuits,radiation detectors,radiation effects,radiation environment characterization,radiation hardening by design,silicon-on-insulator (SOI) technology,space radiation environments,total dose effects,transient radiation effects
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