Evolution of Deep Traps in GaN‐Based RF High Electron Mobility Transistors under High Voltage OFF‐State Stress
PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS（2022）
关键词
AlGaN,GaN HEMTs,deep traps,degradation,DLTS,RF
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要