X-ray diffraction texture: features for material identification (Conference Presentation)

Polychromatic X-ray scatter is modulated in both angle and energy in a way that encodes a material’s crystalline texture. Various texture quantification metrics have been calculated from X-ray scatter which are typically most informative for fundamental material or crystallographic research. In this work, we quantify material crystalline texture from scatter measurements made using a tabletop energy and angle dispersive diffractometer and show that these X-ray scatter-based metrics have promise as complementary metrics to the material form factor and are particularly suited for material identification applications.