Pseudo- planar Ge-on-Si single-photon avalanche detectors with low noise equivalent power

Infrared Sensors, Devices, and Applications XI(2021)

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摘要
We present a pseudo-planar geometry 26µm diameter Ge-on-Si single-photon avalanche diode (SPAD) detector with temperature insensitive single photon detection efficiency of 29.4% at 1310nm wavelength for applications including free-space LIDAR. A record low dark count rate of 104 counts/s at 125K at an excess bias of 6.6% is demonstrated, with temporal jitter reaching 134ps. The noise-equivalent power is measured to be 7.7x10-17WHz-12 which is a 2 orders of magnitude reduction when compared to comparable 25µm mesa devices. This device represents the state-of-the-art for Ge-on-Si SPADs, and highlights that these Si foundry compatible devices have enormous potential for SWIR single-photon applications.
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