Optimizing the laser diode ray tracing model for LERP system simulation based on likelihood image sampling

european quantum electronics conference(2021)

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Abstract
Ray tracing software is a powerful tool for optical system analysis that provides built-in laser source models. However, these models prove to be inadequate for laser beams with a factor of M 2 far from one, as is the case for high-power multi-mode laser diodes. In certain applications, accurate prediction of the beam shape can be critical to simulation model performance; in opto-thermal simulations of laser-excited remote phosphor (LERP) systems [1] , [2] , overestimation of the high intensity region of the beam can lead to overestimation of the phosphor temperatures calculated. For this reason, a ray tracing laser diode source model was developed based on random sampling from the weighted (likelihood) image of the experimentally measured beam profile.
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Key words
random sampling,phosphor temperatures,likelihood image sampling,laser-excited remote phosphor systems,opto-thermal simulations,beam shape,high-power multimode laser diodes,laser beams,optical system analysis,ray tracing software,LERP system simulation,beam profile,weighted image,ray tracing laser diode source model,high intensity region
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