Detailed surface analysis of V-defects in GaN films on patterned silicon(111) substrates by metal–organic chemical vapour deposition. Corrigendum

Journal of Applied Crystallography（2020）

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摘要

An error in the article by Gao, Zhang, Zhu, Wu, Mo, Pan, Liu & Jiang [J. Appl. Cryst. (2019), 52, 637–642] is corrected.

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关键词

gan films,metal–organic chemical vapour deposition,chemical vapour,substrates,v-defects

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