Hard X-ray in-situ full-field microscopy for material science applications

Irina Snigireva,Ken Vidar Falch,Daniele Casari,M. Di Michiel,Carsten Detlefs,Ragnvald H. Mathiesen,Anatoly Snigirev

OSA High-brightness Sources and Light-driven Interactions Congress 2020 (EUVXRAY, HILAS, MICS) (2020), paper ETu1A.4（2020）

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摘要

Hard X-ray transmission microscopy based on refractive optics is applied as a tool in material science to study microstructure in two or three dimensions with spatial resolution of 100nm. A few possible application areas for the microscope are illustrated.

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关键词

Diffraction Microscopy,X-ray Imaging,Coherent Diffractive Imaging,High-Resolution Imaging

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