Proficiency Testing Scheme of Conducted disturbance at mains terminals in 150kHz∼30MHz using Multi-items

Mi Jincai,Chen Hui,Liu Qunxing, Liu Xin, Chu Rui, Song jun

international symposium on electromagnetic compatibility(2020)

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摘要
The paper introduces a Proficiency Testing scheme of conducted disturbance at mains terminals in 150kHz∼30MHz using Multi-items method, compared with a single item Proficiency Testing scheme, test time and costs is greatly reduced, reliability is largely increased. 150 items which could generate comb signal with stable frequency and stable voltage in the frequency range of 150 kHz to 30MHz were developed. And the item could simulate the power supply, grounding and setup of the actual test sample. Mailed it to 101 participants in parallel to evaluates performance and identifies problems of participants.
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关键词
Proficiency Testing Scheme,Conducted disturbance,Mains terminals,Multi-items,Comb signal
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