Thermally-Aware Layout Design of Β-Ga₂o₃ Lateral MOSFETs
IEEE transactions on electron devices/IEEE transactions on electron devices（2022）
Key words
Logic gates,Metals,Thermal conductivity,Temperature measurement,Conductivity,Substrates,Performance evaluation,Electro-thermal modeling,gallium oxide,MOSFET,nanoparticle-assisted Raman thermometry,self-heating,thermal characterization
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