Evaluation of CIMMYT Wheat Lines under Egyptian Field Conditions to Identify New Sources of Resistance to Leaf Rust

Leaf rust caused by Puccinia triticina Eriks. is a fungal disease of wheat (Triticum aestivum L.), which causes considerable yield loss. Host resistance is the most effective and economical method to minimize yield losses caused by leaf rust. The current research was planned to evaluate the response of 93 wheat genotypes lines selected from 716 wheat genotypes delivered to Egypt by International Maize and Wheat Improvement Center (CIMMYT). These genotypes were evaluated against leaf rust resistance under field conditions at two locations i.e. Behira governorate (Itay El-Baroud Agricultural Research Station) and Menoufia governorate during three successive growing seasons i.e. 2017/2018, 2018/2019 and 2019/2020. Results of the current study showed that 47 wheat genotypes were resistant and had the lowest values of final rust severity (FRS %), average coefficient of infection (ACI) and area under disease progress curve (AUDPC). Also, these genotypes showed desirable/acceptable relative resistance index (RRI) at the two locations during the three growing seasons of the study. Therefore, we can select these genotypes as resistant lines in the breeding program for the resistance of leaf rust.