69‐3: Examination of Degradation Analysis of p‐i‐n Type OLEDs Devices

Daichi Shirakura, Shinji Okamura,Yoshihiko Taguchi,Hikaru Takano, Takahiro Shibamori,Takashi Miyamoto,Junichiro Sameshima

SID Symposium Digest of Technical Papers(2020)

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