In situ thermal behavior of resistance drift in GeTe and Ge2Sb2Te5 nanowires via Raman thermometry
Journal of Materials Chemistry C(2020)
摘要
The time-dependent resistance drift in GeTe and Ge2Sb2Te5 (GST) nanowires is investigated via Raman thermometry.
更多查看译文
AI 理解论文
溯源树
样例
![](https://originalfileserver.aminer.cn/sys/aminer/pubs/mrt_preview.jpeg)
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要