Surface / Interface Analysis for Adhesion of Different Kind of Materials

According to the theory of adhesion, factors that influence adhesion are intermolecular force, chemicalbonding, molecular diffusion, mechanical bonding and so on. However, it is not easy to clarify what kind offactor contributes to adhesion in practical materials. XPS, TOF-SIMS and FT-IR are effective for the analysisof surface composition and chemical structure. Depth profiling techniques that have improved recentlyare making it possible to evaluate the molecular diffusion and the chemical bonding at adhesion interface.Furthermore, it is becoming possible to analyze the adhesive interface from the cross section by AFM-IR andAFM-Raman that can perform vibration spectroscopy with spatial resolution exceeding the diffraction limit oflight. In this article, we will explain analysis methods currently being used to evaluate adhesion interface andits progress. Especially, we explain details of quantification of interfacial functional group by XPS with thechemical modification, and push-in testing for evaluating the mechanical properties of fiber / resin interface inFRP.