Coherent Raman scattering at interfaces (Conference Presentation)

Coherent Raman scattering (CRS) is a popular technique for ultrafast spectroscopy and microscopy studies. CRS is based on a third-order nonlinear light-matter interaction, characterized by a nonlinear susceptibility with nonzero elements for bulk samples. It is challenging to perform CRS measurements at interfaces, as bulk contributions can often overwhelm. We have developed a surface-sensitive approach for CRS spectroscopy and microscopy, which enhances the sensitivity to interfacial processes by at least tenfold.