Erratum: “Microstructure and dislocation of epitaxial InN films revealed by high resolution x-ray diffraction” [J. Appl. Phys. 103, 023504, (2008)]B. Liu,R. Zhang,Z. L. Xie,H. Lu, Q. J. Liu, Z. Zhang, Y. Li,X. Q. Xiu,P. Chen,P. Han,S. L. Gu, Y. Shi,Y. D. Zheng,W. J. SchaffJournal of Applied Physics（2008）引用 0|浏览1暂无评分AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
