Human vs. Machine, the Eyes Have It. Assessment of Stemphylium Leaf Blight on Onion Using Aerial Photographs from an NIR Camera

Aerial surveillance could be a useful tool for early detection and quantification of plant diseases, however, there are often confounding effects of other types of plant stress. Stemphylium leaf blight (SLB), caused by the fungus Stemphylium vesicarium, is a damaging foliar disease of onion. Studies were conducted to determine if near-infrared photographic images could be used to accurately assess SLB severity in onion research trials in the Holland Marsh in Ontario, Canada. The site was selected for its uniform soil and level topography. Aerial photographs were taken in 2015 and 2016 using an Xnite-Canon SX230NDVI with a near-infrared filter, mounted on a modified Cine Star-8 MK Heavy Lift RTF octocopter UAV. Images were taken at 15-20 m above the ground, providing an average of 0.5 cm/pixel and a field of view of 15 x 20 m. Photography and ground assessments of disease were carried out on the same day. NDVI (normalized difference vegetation index), green NDVI, chlorophyll index and plant senescence reflective index (PSRI) were calculated from the images. There were differences in SLB incidence and severity in the field plots and differences in the vegetative indices among the treatments, but there were no correlations between disease assessments and any of the indices.