Detection of siloxane thin films on glass substrate using IR ratio-reflectance spectrum

Vladimir Ivanovski,Ireneusz Piwoński,Dariusz Guziejewski,Thomas G. Mayerhöfer

Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy（2022）

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摘要

•New method for thin-film investigation using IR-reflectance spectra was developed.•Correlation between IR ratio-reflectance spectra and film structure was proposed.•Properties of organo-silane films on glass discussed using ratio-reflectance spectra.•IR ratio-reflectance spectra correlation with morphology of the coating proposed.

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关键词

Specular reflectance spectrum,Thin films,Silane,Siloxane,Glass

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