Single Event Effects Characterization of the ST-DDR4 Spin-transfer Torque Magnetoresistive Random Access Memory (STT-MRAM)

2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)（2021）

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摘要

We present single event effects (SEE) evaluation of the Everspin Technologies 1Gb non-volatile ST-DDR4 spin-transfer torque MRAM.

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关键词

memory,st-ddr,spin-transfer,stt-mram

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