Simulating dark-field x-ray microscopy images with wave front propagation techniques

Dark-Field X-ray Microscopy (DFXM) is an x-ray diffraction microscopy technique capable of imaging defects in the bulk of extended crystalline samples, and to quantitatively measure strain information. We present numerical simulations of image-formation in such a microscope using numerical integration of the dynamical Takagi-Taupin Equations (TTE) and wave front propagation. We validate the methods by comparison to experimental data from a highly perfect single crystal of diamond containing a single stacking fault defect in the illuminated volume.