Research of Microprocessor Electrical Fast Transient Pulse Group Testing
2021 6th International Conference on Integrated Circuits and Microsystems (ICICM)（2021）
Abstract
Electrical Fast Transient Pulse (EFT) is a kind of transient pulse interference caused by lightning, grounding fault or the switching of inductive load in circuit. Researchers from Cisco, Intel and other companies have proposed a model to simulate the EFT pulse coupling into the IC’s power pin and input/output (I/O) pin through the EFT transient disturbance rejection direction, which is used to st...
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Key words
Couplings,Micromechanical devices,Power supplies,Microcontrollers,Voltage,Interference,Pins
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