A Novel Chip Surface Shielding Structure for Promoting Insulation Capability of High Voltage Semiconductor Chip

IEEE Transactions on Electron Devices(2022)

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Abstract
Partial discharge which often occurs at channel stopper of high voltage chip will cause insulation damage of chips which is harmful to the device application. Thus, it is important to improve the whole design to promote chip insulation capacity. In this brief, a novel chip surface shielding structure named U-protector is proposed which can promote the insulation capability of high voltage chips. T...
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Key words
Partial discharges,Insulation,Packaging,Partial discharge measurement,High-voltage techniques,Voltage measurement,Analytical models
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