微动开关接触可靠性提升工艺创新实践
Electromechanical Components(2021)
Abstract
逻辑通断不合格是影响PDU的主要原因,而微动开关的可靠性是逻辑通断不合格的主要原因,对此进行了分析、研究,提出了改进方案,并进行了闭环验证.
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