Resolution Limits of the CRYCAM X-ray Microradiography Camera
semanticscholar(2019)
摘要
Recently, high resolution micrography became of great interest. One of the approaches are very thin scintillator layers of about 5-20 micrometers used to achieve spatial resolution below one micrometer. Such thin screens are mainly used in microCT and nano-CT systems with either micro-focus X-ray tubes or with synchrotron sources. This work deals with a high resolution CMOS camera together with different optical systems and different single crystal scintillators in application for low energy X-ray micro-radiography. The light distribution on the screen is transferred by an optical system to a high-resolution chip. A theoretical modeling and practical comparison of several set-ups has been done. Thin screens used were prepared from different scintillators. The resolution is presented on test patterns.
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