Failure analysis of ESD damage on interconnects in LCD GOA

Ye Wang,Guicui Fu, Pengcheng Tian,Bo Wan, Jian Li, Yong Song, Hongjun Yu, Hailin Xue, Chuncheng Che, Dongsheng Huang, Keyi Rong, Yutai Su, Weixiong Chen,Xin Li

Engineering Failure Analysis（2022）

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摘要

•The root cause of GOA interconnects failure is determined to be ESD in VUV cleaning process.•Experiments exhibit the same failure and validate our analysis of failure.•ESD does not occur when two equal-length interconnects are irradiated simultaneously.•The failure severity versus the design parameter of interconnects is modeled.

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关键词

Liquid Crystal Display (LCD),Electrostatic Discharge (ESD),Gate driver on array (GOA),VUV cleaning,Interconnects failure

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