Particle-in-Cell Simulations of ION Dynamics in a Pinched-Beam Diode1

J. C. Foster,S. B. Swanekamp,D. D. Hinshelwood,A. S. Richardson,P. E. Adamson,J. W. Schumer,P. F. Ottinger,D. Mosher

2021 IEEE International Conference on Plasma Science (ICOPS)（2021）

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关键词

diode play,ion beam quality,ion flow,diode region,field emitted electrons,neutralizing electron flow,high-energy diode flow,ion beam uniformity,ION dynamics,pinched-beam diode,anode,intense ion beam,electron dynamics,pinched beam diode,electron charge,diode gap,ion charge distribution

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