TOWARDS THE OPTIMIZATION OF PHOTOCATHODE PROPERTIES VIA SURFACE SCIENCE TECHNIQUES: A STUDY ON Cs3Sb THIN FILM GROWTH

Surface science measurement techniques such as x-ray photoemission spectroscopy (XPS) and scanning tunnel microscopy (STM) can provide quantitative information about the composition and the morphology of thin film samples. We successfully transferred Cs-Sb samples from the growth chamber to a surface science XPS/STM system by use of an UHV suitcase and measured their properties. This will allow to study the properties of photocathode films and ultimately how to control the growth process to achieve the best performances, including high efficiency, ruggedness and low emittance.