A benchmark for single-electron circuits

Top: Counting statistics (ptx) of an error signal (x) recorded by a single-charge detector, shown as a function of the number of repetitions (t) of the transfer operation; these repetitions were performed by the single-electron circuit. Bottom: Simulation of the underlying "random walks" (blue lines) based on this measurement signal. Here, the width of the line shows how frequently a step takes place. The red line exemplifies a single path of the error signal. Credit: Ubbelohde