Imaging of Highly Dipping Strata and Growth Fault in Vainateyam Area, KG Basin Using Insitu Angle Domain Techniques

The study area, Vinateyam, KG Basin, is both structurally and stratigraphically complex due to presence of high-dips, rapid lateral structural variation and complex growth faulting. So imaging of high dips, delineation of fault networks and enhancing the continuity of deeper sequences are prime imaging objectives. In this work full azimuth reflection grid tomography is preformed to build a depth interval velocity model that can properly encounter structural variations. Local angle domain wavefield separation, specular and diffraction imaging is then performed. The specular stack imaged highly dipping reflectors and shows enhance continuity of deep-seated structures. Diffraction stack clearly brought out major-minor faults and the steep dip events. Combination of specular and diffraction stack gives good confidence on growth fault delineation. Significant improvements are seen in terms of reflector continuity, fault delineation, and imaging of deeper reflector.