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A GEM-based High-Rate X-Rays Diagnostic for Flux Measurement During High Voltage Conditioning in Vacuum Insulated Systems

O. McCormack,A. Muraro,G. Croci,G. Grosso,N. Pilan,L. Lotto,S. Spagnolo,A. De Lorenzi,R. Gobbo,C. L. Fontana,G. Gorini,M. Fincato,E. Martines,F. Pino,D. Rigamonti,E. Perelli Cippo,F. Rossetto,E. Spada,M. Zuin,M. Cavenago,M. Tardocchi

2020 29th International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV)（2021）

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关键词
GEM,X-RAYS,HV
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