Invited: Polarization engineering in GaN-based normally-off transistors

2021 IEEE International Meeting for Future Electron Devices, Kansai (IMFEDK)(2021)

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摘要
Proposal and processing aspects of the proof-of-concept InGaN/AlGaN metal-oxide-semiconductor high-electron-mobility transistor (MOS-HEMT) with etched gate recess and access regions are addressed. Large negative polarization charge in the MOS gate stack provides the HEMT normally-off operation, while free electrons are populated at access regions after the etching. Self-aligned approach was used f...
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关键词
component,normally-off HEMT,GaN,InGaN,polarization,threshold volatge instability
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