The influence of adhesive tape on L0 light leakage of TFT-LCD products after reliability test
2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)（2021）
Abstract
L0 light leakage often happens to TFT-LCD products after reliability test. The deformation of the backlight unit has a significant effect on L0 light leakage. The level of backlight deformation transferred to panel directly affects the level of L0 light leakage. This paper analyzes the causes of angle leakage, simulates the effect of different base material tape on stress and deformation of panel,...
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Key words
Integrated circuits,Temperature,Internal stresses,Industrial control,Failure analysis,Glass,Reliability
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