Research on reducing electro-static discharge of tearing film of EPD

Haowei Zou,Xin Li,Yong Song,Hanqing Liu, Junru Ma,Hongjun Yu,Chuncheng Che,Hailin Xue

2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)（2021）

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摘要

In this paper, we focused on reducing electrostatic discharge (ESD) of tearing film of Electro-phoretic display (EPD). The failure mechanism proves: ESD is generated when the film is torn, introduced through the surface ITO, and conducted to the weak points inside the pixel to breakdown, resulting in poor white spots of the module, with a failure rate as high as 43%. We mainly made improvements fr...

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关键词

Temperature sensors,Temperature,Surface discharges,Failure analysis,Humidity,Electrostatic discharges,Thin film transistors

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