Studying the heterogeneity of the Cr(x)Ti(1-x)Ch(2) (Ch = S, Se) single crystals using X-ray scanning photoemission microscopy
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS(2022)
摘要
The morphology of the heterogeneous CrxTi1-xSe2 and CrxTi1-xS2 single crystals has been studied using X-ray scanning photoemission microscopy (SPEM) and angular resolved photoemission spectroscopy (ARPES). A direct method of SPEM provided us the insight into the origin of the blurred ARPES images for Cr0.78Ti0.36Se2 single crystal. Using SPEM, we confirmed the formation of the CrSe2-based structural fragments inside the CrxTi1-xSe2 single crystals with x >= 0.75. The chemical composition of the forming structural fragments depends on the chalcogen (S, Se) forming the crystal lattice.
更多查看译文
关键词
Titanium dichalcogenides,Photoelectron spectroscopy,Structural fragments,Photoelectron microscopy,Electronic structure
AI 理解论文
溯源树
样例
![](https://originalfileserver.aminer.cn/sys/aminer/pubs/mrt_preview.jpeg)
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要