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LED source interferometer for microscopic fringe projection profilometry using a Gates’ interferometer configuration

Optics and Lasers in Engineering(2022)

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摘要
•A microscopic fringe projection profilometry system based on Gates' interferometer is introduced.•The proposed method uses a LED as a light source.•A beamsplitter cube is implemented as a core interference element.
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关键词
Surface metrology,Gates’ interferometer,Fringe projection,Resolution,Microscopic fringe projection profilometry
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